| 摘要 |
PURPOSE:To improve the efficiency of a test by providing 2nd contact arrays which pair with a 1st contact array and have specific intervals with the 1st contact array respectively. CONSTITUTION:The 1st contact array 11 consisting of a contact part 3 provided to a mold main body and contact arrays 12-13 which pair with the array 11 and have the specific intervals with the array 11 are provided. Then the interval D1 between the arrays 11 and 12, the interval between the arrays 11 and 13, and the interval D3 between the arrays 11 and 14 are set to values corresponding to the lead intervals of a semiconductor device to be measured, and consequently suitable contact arrays can be selected according to the semiconductor device, so that test efficiency is improved.
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