发明名称 TESTING OF ELECTRONIC CIRCUIT
摘要 PURPOSE:To enable electrical test efficiently, by connecting an SIP type IC module to a mother board through a flexible connection member having a terminal for connection between the mother board and the SIP type IC module at both ends thereof. CONSTITUTION:An SIP type IC module 1 to be tested is connected to a specified position on a mother board 2 through a flexible connection member 3 so arranged that a head 6 having a lead terminal 5 of the same shape as that of a lead terminal of the module 1 is connected at one end of a flexible cable 4 while an SIP type IC socket 8 is connected to the other end thereof. Under such a condition, probes of a measuring device are put on surface electrodes of the module 1 to perform an electric test. In such a method, the position and direction of the module 1 connected by bending the member 3 is varied to allow free expansion of intervals between modules 1. This enables accurate connection of probes of the measuring device to surface electrodes of the modules 1 to be tested.
申请公布号 JPS63168579(A) 申请公布日期 1988.07.12
申请号 JP19860311935 申请日期 1986.12.29
申请人 TOSHIBA CORP 发明人 KAGEYAMA SEIICHI
分类号 G01R31/28 主分类号 G01R31/28
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