发明名称 X-RAY ANALYZER
摘要 PURPOSE:To widen the range of objects which can be analyzed by providing a means for rotating a sample around an X-ray projection position and providing a spectroscope consisting of a spectral crystal and detector or ray source for excitation rotatably around the sample. CONSTITUTION:The sample S is provided rotatably around the X-ray projection position by a sample table T. An X-ray tube 1 is mounted on an arm A pivotally supported coaxially with the revolving shaft of the table T. A solar slit S2 is excited by the projection X-ray and takes the parallel X-ray fluxes to be entered to the spectral crystal 2 out of the X-rays released from the sample S. A goniometer B has a twice angle mechanism which rotates a detector 3 around the spectral crystal 2 at the rotating angle of twice the rotating angle of the spectral crystal 2. The sample S is rotated and is so set that the direction of the solar slit S2 is brought at a set taking out angle theta2. The arm A is the rotated to set an X-ray projection angle theta1. The goniometer B is thereafter operated to execute wavelength scanning.
申请公布号 JPS63167251(A) 申请公布日期 1988.07.11
申请号 JP19860309942 申请日期 1986.12.27
申请人 SHIMADZU CORP 发明人 HASHIMOTO SEIJI
分类号 G01N23/223 主分类号 G01N23/223
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