发明名称 SEMICONDUCTOR MANUFACTURING EQUIPMENT
摘要 PURPOSE:To form a silicon oxide film and a silicon nitride film, and, further, form an amorphous silicon film with a high speed, by installing an introduction gas feeding inlet independently of a reaction gas feeding inlet, and introducing an introduction gas into a reaction chamber after turning it into plasma. CONSTITUTION:Before a silicon oxide film is formed on a substrate 2, oxygen or nitrogen suboxide 14 is introduced into a reaction chamber 1 after it is supplied to a plasma generating tube 18 and excited with microwave. The oxygen or the nitrogen suboxide in a excited state reacts with silane 5 which is introduced through a reaction gas feeding inlet 5 and decomposed by a carbon dioxide gas laser beam 2, and forms a silicon oxide film on the substrate 2. When a silicon nitride film is formed on the substrate 2, nitrogen or ammonia 14 is supplied and introduced into the reaction chamber 1 after it is excited with microwave. The nitrogen or ammonia in a excited state forms a silicon nitride film in the same manner. When an amorphous silicon film is formed on the substrate 2 with a high speed, argon 14 is supplied, and, in the same process, the amorphous silicon film can be rapidly formed together with the decomposition action of silane 5.
申请公布号 JPS63166216(A) 申请公布日期 1988.07.09
申请号 JP19860314111 申请日期 1986.12.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 ODA MASAO;KOBAYASHI TOSHIYUKI;KINOSHITA YOSHIMI
分类号 H01L21/31;H01L21/205;H01L21/263 主分类号 H01L21/31
代理机构 代理人
主权项
地址