发明名称 LIGHT INTERFERENCE TYPE FILM THICKNESS MEASURING APPARATUS
摘要 PURPOSE:To perform highly accurate measurement by making it possible to increase the contrast between a light part and a dark part even when there is optical anisotropy, by arranging a polarizer so that a polarizing axis is set on the incident light path of white light in an arbitrary straight line polarizing direction. CONSTITUTION:The white light emitted from a white light source 1 is condensed to the pinhole on a pinhole 3 by a condenser 2 and further converted to parallel light by a collimator lens 4 to become only linear polarized light having the vibration direction of a P- or S-wave component by a polarizing plate 5 and said linear polarized light is incident to the incident point of an object 6 to be measured through the incident window of a condenser 7. The reflected light from the object 6 is guided to a fractionating lens 11 and only the same direction component of the emitted light of each optical fiber 10 among the reflected lights condensed to the condenser 7 is guided to an extracting pinhole plate 12 and a light having a light part and a dark part is amplified by an image intensifier 15 through a collimator lens 13, a plane diffraction lattice 14 and an image forming lens 15 and the intensity of light at every wavelength is detected on a linear image sensor 18. Then, the wavelengths of the light and dark parts are calculated to operate the film thickness of the object 6.
申请公布号 JPS63163105(A) 申请公布日期 1988.07.06
申请号 JP19860315129 申请日期 1986.12.25
申请人 TORAY IND INC 发明人 YAMAZAKI CHIKAYASU;HAYASHI MUTSUMI;TORIKAI JUN
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
主权项
地址