发明名称 Eddy current surface mapping system for flaw detection
摘要 A system and method for nondestructive testing of a part using eddy current impedance measuring techniques. An eddy current probe is positioned above the surface of the part for measuring an induced eddy current signal and generating an electrical signal representative thereof. A first and second movement signal is generated representative of a first and second scan direction of the probe. Relative movement is effected between the probe and the part, whereby the probe scans the part for producing electrical signals varying as a function of eddy current signal. The electrical signals are converted to mutually perpendicular drive signals representative of the eddy current signature at a corresponding location of the part. The first and second movement signals are combined with the mutually perpendicular drive signals of and second composite signal which varies as a function of the movement of the probe and eddy current signal. The first and second composite signals are applied to a display means for generating a three-dimensional image representative of irregularities in the part.
申请公布号 US4755753(A) 申请公布日期 1988.07.05
申请号 US19860887303 申请日期 1986.07.23
申请人 GENERAL ELECTRIC COMPANY 发明人 CHERN, ENGMIN J.
分类号 G01N27/90;(IPC1-7):G01N27/90;G01R33/12 主分类号 G01N27/90
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