发明名称 PHOTORESIST REMOVING DEVICE
摘要 PURPOSE:To enhance the efficiency of removing ashing and to improve a working efficiency by providing a corona generator or a hydrogen plasma generator to activate oxidation-reduction reaction, and providing a preposition chamber to reduce the number of vacuum processes. CONSTITUTION:A wafer 10 necessary to remove a photoresist is introduced into a preposition chamber 2, which is then evacuated in vacunm, and predetermined number of wafers 10 are fed to a processing chamber 1. Then, the chamber 1 is evacuated in vacuum, oxygen gas or ozone is supplied from a supply hole 7, and ozone is generated by irradiating it with an ultraviolet ray. The photoresist is ashed by the ozone, and discharged from a discharge hole 8. Further, a corona generator 5 generates ozone near the wafer 10 to completely remove the remaining resist. Since the chamber 2 of vacuum state is provided, it is not necessary to evacuate in vacuum the chamber 1 each time the wafer 10 is inserted. Thus, the ashing removal can be enhanced in its efficiency, and its working efficiency can be enhanced.
申请公布号 JPS63160229(A) 申请公布日期 1988.07.04
申请号 JP19860307175 申请日期 1986.12.23
申请人 ORC MFG CO LTD;TAKAHASHI KYOSUKE 发明人 ADACHI NOBUO;KINOSHITA SHOICHI;TSUTANO HIROSHI;ISHIBASHI NORIO;TAKAHASHI KYOSUKE
分类号 H01L21/302;G03C11/00;G03F7/00;G03F7/42;H01L21/3065 主分类号 H01L21/302
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