发明名称 MEASURING INSTRUMENT FOR ELECTRONIC CIRCUIT
摘要 PURPOSE:To improve the operating rate of a device by providing a means which diagnoses whether or not plural pieces of hardware for measurement are in a state where there is no hindrance to the execution of a measurement program and a selecting means which selects stand-by hardware according to the diagnostic result. CONSTITUTION:A computer 1a edits the measurement execution program by using a tester language or translates it into object codes which can be executed by a sequence controller 2a. Then if a 3rd measurement voltage source 5 becomes faulty when a certain electronic circuit is measured, 1st-5th voltage sources 3-7 for measurement are named P1-P5 in order and a controller 2a diagnoses functions, so that it is judged that the voltage sources P1, P2, P4, and P5 are normal. On the other hand, when voltages sources that the computer 1a requires are denoted as Pa-Pc, object codes of the execution program are determined so that Pa=P1, Pb=P2, and Pc=P4 when the functions of those voltage sources are represented as P (same function). Therefore, the measurement execution program and hardware correspond to each other one to one and a measurement is taken.
申请公布号 JPS63157075(A) 申请公布日期 1988.06.30
申请号 JP19860304879 申请日期 1986.12.19
申请人 MITSUBISHI ELECTRIC CORP 发明人 OGATA TERUAKI
分类号 G01R31/28 主分类号 G01R31/28
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