| 摘要 |
<p>A probe (10) is connected to a tri-state circuit (30) which generates a programmable dc voltage to be impressed on a circuit node by the probed tip (12). Memory (24) is provided for storing any change in tip voltage signifying a fault in the tri-state test. A separate circuit (18) detects programmable data levels to eliminate gray area ambiguities. Further, a quick-check circuit (32) determines whether a node is short circuited by determining whether toggling can occur at a node.</p> |
