| 摘要 |
To test a vacuum switching chamber of a vacuum switch, a high-frequency current is applied to the closed vacuum switching chamber (13) and, after a certain period of time, the switching contacts of the vacuum switching chamber (13) are opened. During this process, the current which may still be flowing after the opening of the switching contacts (14, 15) is detected. If current is measured, the vacuum switching chamber (13) is defective. <IMAGE>
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