| 摘要 |
PURPOSE:To raise the accuracy of fine particle measurement by deriving the time width for generating a scattered light intensity variation by which a value of a time series data of an electric signal obtained in accordance with a laser scattered light exceeds a prescribed value. CONSTITUTION:A data obtained with respect to a laser scattered light which follows up passing of particles obtained from a photoelectric converter 27 is brought to sampling through a sampling unit 41, and written in a time series use memory 43. Subsequently, in a CPU unit, the time width for generating a scattered light intensity variation which exceeds a prescribed value is derived from a value of a time series data. Next, by comparing this time width with the time width by which fine particles pass through the diameter in the depth direction of an elliptical luminous flux for constituting a particle detecting area, by a comparator 40b, an increase/decrease variation of a counting value being a recognition object is recognized as a counting value variation of the scattering intensity which follows up passing of particles.
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