| 摘要 |
PURPOSE:To take a test at a speed nearly as fast as in actual use by providing a storage circuit which stores test data and output data of a function circuit in an LSI to be tested. CONSTITUTION:A 1st switching circuit 2 is operated to connect the output of a shift register 1 so that the function circuit 10 is short-circuited. Then while the test data is outputted from the shift register 1 to the function circuit 10 successively, the output data from the function circuit 10 is stored at the tail of the queue in the shift register 1 successively. At this time, the function circuit 10 is operated at a specific operating speed to obtain the output data and a 2nd switching circuit 3 is operated after all output data are stored to make a connection so that the data stored in the shift register 1 are outputted. Lastly, the output data of the function circuit 10 stored in the shift register 1 are read out at the speed of the ability of an LSI tester to decide whether or not the function circuit 10 is normal.
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