发明名称 FAULT ANALYSIS SYSTEM FOR DIAGNOSING DEVICE
摘要 PURPOSE:To provide margin to a storage area of a fault information storage means by starting a fault analysis means, collecting fault information from a processing unit causing a fault, storing it into a fault information storage means and displaying the analyzed result. CONSTITUTION:A fault analysis means 30 requests fault information EIF1 to a fault information collection means 40. The means 40 collects the fault information EIF1 from a processing unit having a fault, supplies it to the means 30 to store the fault information to the fault information storage means 60. The means 30 references the state of the fault information EIF1 and decides whether the next fault information EIF2 is requested or the fault location is pointed out. In requiring the fault information EIF2, the fault information is requested with similar method to the means 40, the fault information is acquired to advance the procedure one after another. When the fault location point-out is reached, the fault location information is transferred to the fault information display means to supply the fault location information to the operator.
申请公布号 JPS63150743(A) 申请公布日期 1988.06.23
申请号 JP19860299120 申请日期 1986.12.16
申请人 NEC CORP 发明人 SEKIYA FUJIO
分类号 G06F11/34;G06F11/22 主分类号 G06F11/34
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