发明名称 Annealing method for compound semiconductor substrate
摘要 An annealing method for a GaAs wafer which uses incoherent light, e.g., infrared light generated from tungsten lamp, halogen lamp, etc. and a GaAs guard ring which surrounds the GaAs wafer. The thickness of the guard ring is 1.5 times more than that of the GaAs wafer, the internal diameter of the guard ring is less than diameter of GaAs wafer plus 3 mm and the width of the guard ring is less than 10 mm.
申请公布号 US4752592(A) 申请公布日期 1988.06.21
申请号 US19860935827 申请日期 1986.11.28
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TAMURA, AKIYOSHI;ONUMA, TAKESHI
分类号 H01L21/26;H01L21/265;H01L21/268;H01L21/324;(IPC1-7):H01L21/265 主分类号 H01L21/26
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