| 摘要 |
<p>An X-ray diagnostic apparatus comprises an X-ray radiation source for generating an X-ray and projecting the same toward an object, an X-ray detector for detecting the X-ray which has transmitted through the object to derive a total X-ray intensity distribution signal of the object including a primary X-ray signal component and a scattered X-ray signal component caused by scattered X-rays and system structural factors, a signal processor which processes the X-ray intensity distribution signal detected from the X-ray detector in such a manner that a scattered X-ray intensity distribution which is pre-calculated based upon the X-ray intensity distribution signal is eliminated from an X-ray intensity distribution obtained from the X-ray intensity distribution signal so as to derive a distribution function of the primary X-ray signal component without adverse influences on the scattered X-ray signal component, and a monitor for displaying a distribution form based upon the distribution function of the primary X-ray signal component.</p> |
