发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent breakdown due to an abnormal high voltage applied to an input terminal, by connecting a protection transistor having a gate insulating film thicker than that of a transistor to be protected, to the input side of the transistor to be protected. CONSTITUTION:When an abnormal pulse is applied to an external terminal 1, the pulse reaches a connection point P1 after it is slightly delayed by a diffusion resistor R1 and a diode D1 and a capacitor C1 connected to the resistor, and makes the state of a protection transistor Ts turn on. In this case, the transistor Ts is not broken down by the voltage at the point P1 as it has a thick gate insulating film. Then the voltage at P1 reaches P2 with a delay time due to a diffusion resistor R2 and a capacitor C2. When it reaches at P2, the transistor Ts has already turned on, so that this voltage is absorbed by a capacitor Cs of large capacity connected between drain and ground, and is prevented from applying to the transistor T1 to be protected.
申请公布号 JPS63146469(A) 申请公布日期 1988.06.18
申请号 JP19870202930 申请日期 1987.08.14
申请人 NEC CORP 发明人 TOKUYAMA KENJI
分类号 H01L27/088;H01L21/8234;H01L27/02;H01L29/78 主分类号 H01L27/088
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