发明名称 SAMPLE IMAGE DISPLAY DEVICE
摘要 PURPOSE:To obtain a sample image having a high resolution and no strain by providing a circuit generating deflection signals Xc and Yc of a cathode ray tube to deflection signals Xo and Yo of a mirror body by a specified relation, and a circuit adding a specified dynamic correction quantity DELTAVG to a voltage applied to a focus grid of a cathode ray tube. CONSTITUTION:A circuit generating deflection signals Xc and Yc applied to CRT to deflection signals Xo and Yo applied to a mirror body by a relation of the formula I with regard to a deflection strain, and a circuit applying a dynamic correction quantity DELTAVG in the formula II to a voltage applied to a focus grid of CRT with regard to fading by a image surface curvature aberration are provided. C1-C6 are factors in the formulas. The main parts of a sample image display device are formed by the mirror body 1, a deflection signal generator 3, CRT correction part 6, focus grid power source 17, and CRT 21. The CRT correction part 6 is composed of six multipliers 7-10, 12, 13, and three adders 11, 14, 18. This enables a sample image display having a high resolution and no image strain to be made.
申请公布号 JPS63143732(A) 申请公布日期 1988.06.16
申请号 JP19860288823 申请日期 1986.12.05
申请人 HITACHI LTD 发明人 NISHIOKA TETSUYA
分类号 H01J37/22;H01J37/147;H01J37/21 主分类号 H01J37/22
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