发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To reduce the generation of dust at the time of programming, and to improve reliability by forming a two-terminal element becoming conductive through breakdown of an insulating film by voltage higher than a fixed value applied between two electrodes. CONSTITUTION:An insulating film 13 in thickness, in which the tunneling effect can be ignored, and a first electrode consisting of an n-type diffusion layer 14 and a second electrode composed of a polycrystalline silicon layer 15 each shaped onto both surfaces of the insulating film 13, holding the insulating film are formed. An Al wiring layer 17 connected to the n-type diffusion layer 14 is grounded, voltage at a value such as 20V is applied to an Al wiring layer 18 connected to the polycrystalline silicon layer 15, and the insulating film 13 made up of a gate oxide film is broken, thus making the first and second electrodes conductive. Consequently, two kinds of lines or rows can be specified by using n two-terminal elements. The specified lines or rows are replaced with spare lines or rows, thus constituting a redundancy circuit.
申请公布号 JPS63144546(A) 申请公布日期 1988.06.16
申请号 JP19860293815 申请日期 1986.12.09
申请人 NEC CORP 发明人 TSURUTA HIROKI
分类号 H01L21/82;H01L21/3205;H01L27/10 主分类号 H01L21/82
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