| 摘要 |
PURPOSE:To perform an efficient inspection even in case electronic parts provided with lead parts having internal and external bends are conveyed by a method wherein the electronic parts to be conveyed facing the lead parts upward are inspected by a first inspecting means, non-defective electronic parts only are inverted after this inspection and these electronic parts to be conveyed facing downward are inspected by a second inspecting means. CONSTITUTION:A rotation inverting part 23 is provided at the terminal part of an horizontal conveying path 17. A non-defective IC 1, the molded state of whose rear and the state of whose lead parts are decided to be normal, is sent out to an horizontal conveying path 24 opposing to the conveying path 17 when being rotated at 180 deg. and a defective IC 1, whose above states are decided to be abnormal, is so contrived as to be excluded to a defective IC housing box through an excluding chute opposing to the conveying path 17 when being further rotated at 90 degrees (270 degrees). Hereby, the IC 1 decided to be a defective by the images of first and second inspecting parts 21 and 22 is eliminated and the non-defective IC 1 is vertically inverted, in short, is inverted in such a way that lead parts 1a are faced downward and a marked surface 1c is faced upward and is so contrived as to be sent to the horizontal conveying path 24.
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