发明名称 SELF-DIAGNOSING CIRCUIT FOR PERIPHERAL EQUIPMENT
摘要 PURPOSE:To eliminate the time limit caused when the capacity of a diagnosis program is limited or the diagnosis contents are increased, by providing a self- diagnosing function in addition to a control program. CONSTITUTION:When the data received from a host device is not coincident with the print data but related to a diagnosis program, a switch circuit 5 recognizes a loading end state of the program to a memory circuit 4 and switches the control of a control part 6 to a mode related to the diagnosis program stored in the circuit 4 from the mode related to a control program stored in a program memory 3. Then, the diagnosis program loaded from the host device is driven. Thus, it is possible to diagnose the program independently of the control program stored in a printer. Then, the limit is eliminated for the capacity of the diagnosis program together with no time limit caused by execution of the self-diagnosis.
申请公布号 JPS63138434(A) 申请公布日期 1988.06.10
申请号 JP19860285286 申请日期 1986.11.30
申请人 NEC CORP 发明人 NAKAZAWA YOKO
分类号 G06F11/22;G06F13/00 主分类号 G06F11/22
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