发明名称 TEMPERATURE ABNORMALITY PROCESSING SYSTEM
摘要 PURPOSE:To prevent the breakdown of data by cutting off the power supply of a peripheral circuit after processing the prescribed abnormal mode when the temperature abnormal of the peripheral device is reported to a host device. CONSTITUTION:When the temperature abnormality of a peripheral device 3 is detected by a temperature abnormality detecting means 9, the temperature abnormality is reported to a host device 1 from the device 3. Thus the device 1 carries out the abnormal mode processing to finish the corresponding data processing, etc., as long as the data under processing is detected. Then the device 1 gives permission to the device 3 to cut off the power supply. Thus the power supply of the device 3 is cut off. In such a way, the power supply of the device 3 is cut off after execution of the proper abnormality processing even though the device 3 has the temperature abnormality. Then it is possible to prevent read/write of the wrong data and to avoid the breakdown of data.
申请公布号 JPS63136120(A) 申请公布日期 1988.06.08
申请号 JP19860281714 申请日期 1986.11.28
申请人 HITACHI LTD 发明人 KANEKO HIDEKAZU;HORIE TSUNEO;NISHINA MASATOSHI
分类号 G06F1/00 主分类号 G06F1/00
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