发明名称 SPECTRUM ANALYZING METHOD AND SPECTRUM ANALYZING DEVICE
摘要 PURPOSE:To easily detect a high frequency component with high accuracy by detecting the radial variation of a cyclotron motion at the time when a microwave obtained from a signal to be measured has been radiated to an electron which is executing a cyclotron motion in a magnetic field. CONSTITUTION:An electron beam 21 emitted from a one-dimensional electron beam generating device 20 executes a cyclotron motion by an external magnetic field H, and reaches an electron beam detector 22. A pole piece of a magnet 25 is cut obliquely and the external magnetic field H has a prescribed gradient, therefore, frequencies of each beam 21-i are different. When a microwave 31 oscillated by a signal for analyzing a frequency is applied to a motion space of the beam 21, the prescribed beam 21 causes a resonance phenomenon, and the radius of the beam becomes large and the beam does not reach the detector 22. Accordingly, by detecting an output of each target of the detector 22, a frequency component of the microwave can be obtained.
申请公布号 JPS63134963(A) 申请公布日期 1988.06.07
申请号 JP19860280835 申请日期 1986.11.27
申请人 CANON INC 发明人 ODA HITOSHI;MIYAWAKI MAMORU;ISHIWATARI YASUHIKO;ARAI RYUICHI;MIZUSAWA NOBUTOSHI;MASUDA YUKIO
分类号 G01R23/16 主分类号 G01R23/16
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