发明名称 |
ISFET-BASED MEASURING DEVICE AND METHOD FOR FABRICATING THE ISFET USED THEREIN |
摘要 |
<p>The measuring device (10) comprises an ISFET (12) used as a chemically selective ion sensor, a reference electrode (20) positioned adjacent the ISFET (12), an amplifier (22) coupled to the ISFET and control/correction circuitry (30) coupled to the ISFET (12), to the reference electrode (20) and to the amplifier (22). The control/correction circuitry (30) is operable to maintain the drain-source current IDS of the ISFET (12) at a constant value and to correct drift effects of the ISFET (12) on the basis of the logarithmic equation: .DELTA.vp = A 1n(t/to +1) where: .DELTA.Vp = potential drift A = scale factor for drift and amplitude to = time constant defining the dependence on time t = time during which the sensor is operative in the event of continuous operation.</p> |
申请公布号 |
CA1237770(A) |
申请公布日期 |
1988.06.07 |
申请号 |
CA19840466881 |
申请日期 |
1984.11.01 |
申请人 |
SENTRON V.O.F. |
发明人 |
LIGTENBERG, HENDRIKUS C.G.;LEUVELD, JOZEF |
分类号 |
G01N27/27;G01N27/30;G01N27/414;G01N27/416;(IPC1-7):G01N27/46 |
主分类号 |
G01N27/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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