发明名称 Method and apparatus for automatically calibrating a graticuled cathode ray tube
摘要 A method and apparatus for automatically calibrating the deflection of an electron beam in a graticuled cathode ray tube. The apparatus includes a microprocessor and digital-to-analog converter for generating input signals of a predetermined accuracy and sending the signals to an amplifier of a cathode ray tube to deflect the electron beam across graticule lines on the faceplate. A phototransistor optically coupled to the faceplate detects the electron beam coinciding with the graticule and in response generates an electrical signal. Signal processing circuitry processes the signal to remove noise from it and retrieve detection signals. The microprocessor receives the detection signals from the signal processing circuitry, compares each detection signal to its corresponding input signal, and adjusts the gain and offset of the amplifier in response to the comparison. Additional circuitry digitally records the beam position relative to the graticule lines.
申请公布号 US4749907(A) 申请公布日期 1988.06.07
申请号 US19850803693 申请日期 1985.12.02
申请人 TEKTRONIX, INC. 发明人 BOATWRIGHT, JOHN P.;FEUERBACHER, ALAN M.;HOLTE, TIMOTHY M.
分类号 G01R13/20;G01R13/22;G01R13/24;G01R13/30;G01R35/00;G09G1/00;G09G1/08;(IPC1-7):H01J31/26;H04N17/02 主分类号 G01R13/20
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