发明名称 ELECTRON MICROSCOPE
摘要 PURPOSE:To hold the first field caught electromagnetically, irrespective of any changeover of the observation mode, by providing a means for a signal in order to compensate for the movement of field caused by changeover of observation mode. CONSTITUTION:During observation of a certain field, when it is required to observe the same field through the transmitting electron microscope image, a signal which commands observation of transmitting image is supplied to an observation mode selection control circuit 21 by means of the observation mode selection button 25b of an input device 25. As a result, the circuit 21 selects the connection of a first selection circuit 17 as indicated by a solid line in the figure. Therefore, a signal sent from a deflection signal generator 19 is supplied to a scanning deflection coils 7a, 7b through a second signal converter 2 and simultaneously it is also supplied to a deflection power supply 15 through a first signal converter 18. Since the signal to be supplied to the deflection power supply 15 is converted so that the field which is the same as the field in the scanning image observation mode can be obtained by the first signal converter 18, the transmitting image in the same field as that in the scanning image observation mode can be obtained on a phosphor plate 26.
申请公布号 JPS59157942(A) 申请公布日期 1984.09.07
申请号 JP19830031273 申请日期 1983.02.25
申请人 NIPPON DENSHI KK 发明人 OBARA KENJI
分类号 H01J37/22;H01J37/147;H01J37/26 主分类号 H01J37/22
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