| 摘要 |
PURPOSE:To enable highly reliable test of ICs, by applying an interrupt to an arithmetic processing circuit when a strobe signal is missed to shift to an abnormality detection processing. CONSTITUTION:When a decision processing program is started, a CPU 2 resets latch circuits 7a and 7b at initial state. Then, a test pattern generator 1 is started to generate a pattern corresponding to a test item and a switching circuit selected corresponding to the test item from among switching circuits R1i (i=1-n) is closed to supply drive signals to respective pins corresponding to inspection items of an IC 10. The circuit R1i is opened according to a specified timing while a circuit R2i corresponding to an output pin is closed. Here, when strobe signals 6a, 6b... for decision circuits 5a, 5b... are missed, an interrupt signal generation circuit 8 generates an interrupt signal according to a gate signal G after the generation of a final storage signal. The CPU 2 starts an abnormality processing program of a memory 11 to perform an abnormality processing.
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