发明名称 Method of manufacturing a bonded structure type semiconductor substrate.
摘要 <p>A method of manufacturing a bonded structure type semiconductor substrate includes: the step of ion-implanting an impurity of a first conductivity type into a first semiconductor substrate (1) of the first conductivity type, thereby to form a first conductivity type ion-implanted layer (2) in a surface region of the first semiconductor substrate (1), the step of causing the first semiconductor substrate (3) to be subjected to a first thermal treatment, and the step of bonding a second semiconductor substrate (3), of a second conductivity type and having a specific resistance of not more than 0.05 OMEGA .cm to a surface (2a) of the ion-implanted layer (2). According to this method, generation of micro voids at an interface can be prevented by performing the thermal treatment.</p>
申请公布号 EP0269294(A1) 申请公布日期 1988.06.01
申请号 EP19870309773 申请日期 1987.11.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HOSHI, TADAHIDE C/O PATENT DIVISION K.K. TOSHIBA
分类号 H01L21/265;H01L21/18;H01L21/331;H01L21/336;H01L29/02;H01L29/68;H01L29/739;H01L29/78;(IPC1-7):H01L21/18 主分类号 H01L21/265
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