发明名称 |
Device for rotating and supporting a temperature probe |
摘要 |
A device for rotatably supporting a temperature probe disposed in an oven for heating a material. The probe has one end provided with a plug and another end for insertion into the material for detecting the temperature thereof. The device includes a socket section secured to one of the wall surfaces of the oven chamber, the socket section nonrotatably supporting a contact mechanism which in turn rotatably and disengageably supports the plug while the contact mechanism receives signals from the temperature probe through the plug.
|
申请公布号 |
US4747712(A) |
申请公布日期 |
1988.05.31 |
申请号 |
US19870038454 |
申请日期 |
1987.04.10 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
GONOH, AKIRA;MASUBUCHI, TOSHIO |
分类号 |
G01K7/16;H01R39/64;H05B6/80;(IPC1-7):G01K13/08;H05B6/64;A47J37/04 |
主分类号 |
G01K7/16 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|