发明名称 Device for rotating and supporting a temperature probe
摘要 A device for rotatably supporting a temperature probe disposed in an oven for heating a material. The probe has one end provided with a plug and another end for insertion into the material for detecting the temperature thereof. The device includes a socket section secured to one of the wall surfaces of the oven chamber, the socket section nonrotatably supporting a contact mechanism which in turn rotatably and disengageably supports the plug while the contact mechanism receives signals from the temperature probe through the plug.
申请公布号 US4747712(A) 申请公布日期 1988.05.31
申请号 US19870038454 申请日期 1987.04.10
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 GONOH, AKIRA;MASUBUCHI, TOSHIO
分类号 G01K7/16;H01R39/64;H05B6/80;(IPC1-7):G01K13/08;H05B6/64;A47J37/04 主分类号 G01K7/16
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