发明名称 Method and apparatus for measuring time dependent signals with a particle probe
摘要 To measure high frequency signal curves at nodes and interconnections of integrated circuits and achieve a good chronological resolution in accordance with the sampling method, extremely short primary electron pulses are used. For such extremely short pulse widths obtainable with beam blanking systems, only individual statistically appearing secondary electrons are registered per pulse, these electrons generating current pulses having different amplitudes and different time behaviors at the output of an energy analyzer. It is proposed that the number of current pulses occurring at the output of the energy analyzer within a prescribed time interval be identified and the quotient, or ratio, thereof, be kept constant with the assistance of a feedback circuit for connection to the voltage of a retarding field electrode. The feedback circuit includes a pulse counter, a digital-to-analog converter, and a spectrometer drive.
申请公布号 US4748407(A) 申请公布日期 1988.05.31
申请号 US19870016696 申请日期 1987.01.28
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 BRUNNER, MATTHIAS;SCHMITT, REINHOLD;WINKLER, DIETER
分类号 H01L21/66;G01N23/225;G01Q30/02;G01R31/26;G01R31/302;G01R31/305;H01J37/28;H01J49/44;(IPC1-7):G01N23/225;G01R31/28 主分类号 H01L21/66
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