发明名称 DETECTOR FOR WHITE FLAW AND BLACK FLAW OF SOLID-STATE IMAGE PICKUP ELEMENT
摘要 PURPOSE:To remove noises and the unevenness of sensitivity by A/D converting outputs from each picture element on an irradiation of uniform beams, obtaining a summing mean value through plural scannings and comparing the value with an output mean value from a plurality of picture elements close to each picture element. CONSTITUTION:The titled detector is driven by an image pickup element 2, to which uniform beams are projected, and a driving circuit 1. Outputs from each picture element of the image pickup element 2 are amplified by an amplifier 3 and converted by an A/D converter 4, and a summing mean value on plural scannings is memorized to a frame memory 5. A decision circuit 6 compares summing mean values at every picture element with an output mean value from a plurality of (n) picture elements close to the picture elements, and decides the picture element as a white flaw or a black flaw when there is a difference of a fixed value or more. Accordingly, random noises are removed through plural scannings, and the unevenness of illuminance of irradiating beams and the unevenness of sensitivity of the image pickup element can be removed through a comparison with the output mean value from a plurality of (n) picture elements.
申请公布号 JPS59163861(A) 申请公布日期 1984.09.14
申请号 JP19830037542 申请日期 1983.03.09
申请人 HITACHI DENSHI ENGINEERING KK 发明人 ISHIMORI HIDEO
分类号 G01N21/88;G01N21/956;H01L21/66;H01L27/14 主分类号 G01N21/88
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