| 摘要 |
PURPOSE:To automatize calibration, and to detect the temperature abnormality of a semiconductor integrated circuit chip without remarkably rising its cost, by providing a circuit for storing temperature characteristics of an element, and comparing its storage contents with momentary element characteristics. CONSTITUTION:A temperature detecting circuit 1 is constituted of diodes D1a, D2a, D1b and D2b, and resistances Ra, Rb for supplying a current to these diodes, and by utilizing a fact that element characteristics depend on a temperature, a signal for reflecting the temperature is outputted. A storing circuit 2 cuts and stores a suitable fuse element, and stores an output voltage of the circuit 1 at a set temperature. A comparing circuit 3 using a differential amplifier compares an output of the circuit 1 with the storage contents of the circuit 2, and the output of the circuit 1 exceeds an allowable temperature stored in the circuit 2, it is decided to be an abnormal temperature, a base voltage of a transistor Qa becomes higher than a base voltage of a transistor Qc, an interrupting signal INT becomes a high level and an interruption is applied.
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