发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To calculate positions of a positioning target and a fuse piece correctly, by forming the upper layer of the target of a metal having a high reflectivity with respect to laser light while forming the lower layer of the same material as the fuse. CONSTITUTION:In order to position a fuse piece 7 for cutting it with laser light, a wafer 3 is irradiated with laser light and the laser light is scanned in the X- and Y-directions so that variance in reflectivity thereof is detected. The upper layer 1b of a target 1 is composed of a metal having a high reflectivity with respect to the laser light. Therefore, the position of the target 1 can be detected easily. The position of a fuse piece 7 connected to a defective circuit is calculated from a distance between a fuse pattern formed in a part of a gate electrode forming mask and the target pattern. The predetermined fuse piece is cut by applying laser light and the circuits are switched over.
申请公布号 JPS63126246(A) 申请公布日期 1988.05.30
申请号 JP19860271836 申请日期 1986.11.17
申请人 HITACHI LTD 发明人 SAWADA JIRO
分类号 H01L21/82;H01L21/268;H01L21/3205;H01L27/10 主分类号 H01L21/82
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