发明名称 DENSITY DISTRIBUTION MEASURING APPARATUS FOR CHARGED PARTICLE BEAM
摘要 PURPOSE:To enable the measuring of an exact beam density distribution, by scanning the cross-section of a charged particle beam turning a probe comprising a conductor connected to a current measuring means to measure a current value generated. CONSTITUTION:A probe composed of a conductor 1 connected to an ammeter 5 and an insulating body 2 is positioned outside a charged particle beam 3. The insulating body 2 is held with a rotary scanning mechanism 7 to allow the moving of the probe on an orbit depicting a circle and to the center of the circle. The ammeter 5 is connected to a computer 6. The probe is set at a specified position and starts to measure by moving on an orbit 4 with the initialization of the ammeter 5. The probe moves inward by the size of the conductor 1 as it makes each rotation on the orbit 4, the operation which is performed until the probe comes to the cross-section center of the beam 3. A current value generated by a charge effect of the beam 3 according to the movement of the probe is stored into the computer 6 at each point of the movement. After the movement thereof, the memory data is processed and displayed as beam density distribution of the beam 3.
申请公布号 JPS63122985(A) 申请公布日期 1988.05.26
申请号 JP19860270660 申请日期 1986.11.12
申请人 MITSUBISHI ELECTRIC CORP 发明人 MIYATA KAZUAKI;JIYONASAN DEI BASUKIN
分类号 H01L21/66;G01R31/302;G01T1/29;H01J37/04;H01L21/027;H01L21/30 主分类号 H01L21/66
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