发明名称 METHOD FOR SCANNING GALVANOMIRROR
摘要 PURPOSE:To make a scan at an optional frequency with high accuracy by controlling a glavanomirror with a COS waveform voltage and sampling a signal from the galvanomirror with a sampling signal expressed by a specific equation. CONSTITUTION:The COS waveform voltage (a) generated by a control voltage generator 1 is corrected by an amplifier 5 based on frequency information (b) so as to make the angle of mirror deflection constant against frequency variation and sent as a control voltage (c) to the galvanormirror 4 to make a scan at an unequal speed. A signal generator 2 which receives a synchronizing signal (d), on the other hand, generates the sampling signal S(t) expressed by the equation. In the equation, N is the number of times of sampling, delta a delta function, alpha phase delay, and omega an angular frequency. An input device 3 receives the signal S(t) to perform sampling on the scanning line of the mirror 4 at equal intervals, its control section extends to the entire area of the half cycle of a mirror operation waveform, and the scanning of optional frequency is performed with high accuracy.
申请公布号 JPS63123013(A) 申请公布日期 1988.05.26
申请号 JP19860269051 申请日期 1986.11.12
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YAMADA OSAMU;KIMURA MINORU;TAKAHASHI HIDEMI;NAITO HIROYUKI
分类号 G01N21/88;G01N21/84;G02B26/10;H04N1/04;H04N1/113 主分类号 G01N21/88
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