| 摘要 |
A test fixture for testing a printed circuit board assembly on a computerized test system includes a vacuum-actuated base which is receivable and securable in electrically connected relation on the test system and a vacuum-actuated test head which is releasably receivable on the base and adapted for receiving a printed circuit board assembly thereon to electrically interconnect the printed circuit board assembly to the test system through the base. The test head is readily interchangeable with other test heads to enable the fixture to be adapted for testing printed circuit board assemblies of different configurations on the test system without disconnecting the base from the test system.
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