| 摘要 |
PURPOSE:To omit a matching job of a tester and to facilitate a test job by using an external pin to control the internal clock signal and deciding the working start point of said clock signal. CONSTITUTION:An external clock signal 1 is applied from a tester and an L level is provided to a signal 2 of an external pin which controls an internal clock signal 3. Under such conditions, the signal 3 is kept in pause within a device. Then the signal 2 is changed to an H level from the L level. In the case of this device, the signal 3 has a rise and starts its working after a single machine cycle 4 from said change of levels of the signal 2. Thus the rise point of the signal 3 is defined as a test reference point 7 to carry out the subsequent tests. As a result, a test job is facilitated owing to omission of a matching job where synchronism is secured between both signals 1 and 3 by means of a tester. |
