| 摘要 |
PURPOSE:To achieve a RAM test in a short time, by making a scan pass connected to an address terminal of a RAM able to shift bidirectionally. CONSTITUTION:It is so arranged that information given to a shift-in data terminal 9 can be scanned in synchronizing a clock given to a shift clock terminal 10. Information given to a reverse shift-in data terminal 18 also can be scanned in synchronizing a clock given to a reverse shift clock terminal 19, which provides a scan pass able to shift bidirectionally. When an address primary test is performed using a pseudo random number as address, the renewal of an address of opposite order by one clock enables a testing in a short time. To achieve this, the scan pass able to shift bidirectionally is used thereby permitting a RAM test in a short time.
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