| 摘要 |
PURPOSE:To enable use for a circuit pattern with a closer circuit pitch, by arranging a probe section for contacting an object to be measured and an energizing section for pressing on the object being measured. CONSTITUTION:A contact type probe consists of a probe section 1 and an energizing section 2. The probe section 1 is made up of a flexible tube 5 through which a wire 4 contacting a circuit 3b of a circuit board 3a in an object 3 to be measured is inserted slidably and a fixing material 6 for fixing the tube 5. The energizing section 2 has an energizing body 7 which abuts the rear end of the wire 4 to press the tip of the wire 4 on the circuit 3b and the energizing body 7 is provided with a plunger 7a. Then, the tip of wire 4 gets in contact with the circuit 3b and then, wire 4 is made to slide so that the plunger 7a abutting a head 4a provided at the rear end of the wire 4 presses the energizing body 7. Thus, the tip of the wire 4 can be pressed on the circuit 3b under a proper pressure by an energizing force of the energizing body 7 against the pressing force of the plunger 7a.
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