| 摘要 |
PURPOSE:To enable the measuring of a wide range of electronic circuit networks at a high speed and with a high accuracy, by computing a frequency spectrum of an input/output pulse waveform from a sampled data. CONSTITUTION:A frequency synthesizer 6 of a low phase noise prescribes a repetition frequency fIN of a pulse generated with a pulse generator 8 and a frequency synthesizer 7 prescribes a sampling frequency fSPL to be applied to a sample system likewise. The synthesizers 6 and 7 are synchronized in the phase therebetween by a signal of a reference frequency from an oscillator 5. A pulse with the frequency fIN generated from the generator 8 is inputted into a sampling head 10 directly or through a device 9 to be tested. An input waveform of the head 10 is sampled by a sampling clock with the frequency fSPL generated from the synthesizer 7. An output of the head 10 is stored into a memory 12 through an A/D converter 11. A data stored temporarily in the memory 12 undergoes a digital signal processing mainly based on a fast Fourier transform analysis with a calculator 13 to measure transmission characteristic and the results of measurement are recorded in an X-Y plotter 14.
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