| 摘要 |
PURPOSE:To achieve a higher inspection efficiency visually spotting the position of a defect on an optical disk with ease, by recording a pattern at a point near the position of the defect after the detection of a defect to find the position of the defect with the point recorded as mark. CONSTITUTION:When a defect is detected at a position X in a certain sector on an optical disk 1, a distance Pa on the circumference to the defect position X is determined with the position of recording a synchronous signal in the sector as reference A. Then, a desired light data pattern is recorded at points located at distances P1 and P2 respectively from the reference position A near the defect position X over a range of specified number of bytes and covering specified several tracks. This facilitates visual checking of the location of the pattern when the optical disk is observed. Then, two locations, at which the light data pattern on the optical disk are recorded, are spotted visually under a microscope thereby enabling the finding of the position X of a defect existing between the two locations. |
