发明名称 FORMATION OF PATTERN
摘要 PURPOSE:To decrease swelling and film thinning in a developing stage by making development with a prescribed developing soln. by using a resist consisting of a homopolymer of a specific monomer or copolymer of said monomer and other radiation decomposition type monomer. CONSTITUTION:The homopolymer of the vinyl monomer expressed by the formula or the copolymer of said monomer and the other radiation decomposition type vinyl monomer (e.g.: trifluoroethyl alpha-chloroacrylate) is used as the positive type resist for radiations. In the formula, R1 denotes methyl, Cl; R2 denotes a (halogenated) alkyl of 1-10C, monovalent hydrocarbon group contg. a normal ratio of Si. After the film consisting of the above-mentioned resist material is exposed by electron rays or the like,the film is developed by using the developing soln. contg. 0.1wt% basic compd. (e.g.: tetramethyl ammonium hydroxide). The swelling and film thinning in the developing stage are then decreased and a high-resolution pattern is formed.
申请公布号 JPS63116151(A) 申请公布日期 1988.05.20
申请号 JP19860261919 申请日期 1986.11.05
申请人 TOSHIBA CORP 发明人 GOKOCHI TORU;WATANABE HARUAKI;TADA TSUKASA
分类号 G03F7/32;G03F7/039;G03F7/30 主分类号 G03F7/32
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