发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PURPOSE:To easily give a decision after a trouble has taken place whether or not the trouble is caused by applying overvoltage on the power source wire of an integrated circuit by a method wherein a detection circuit, consisting of the series circuit having a fuse and a transistor, is connected to the power source wire of a chip. CONSTITUTION:A detection circuit 20 is formed by series-connecting an MOS transistor Q having a short-circuit between a gate and a source, and a fuse F, and said circuit 20 is connected to the power source VCC wire l of the chip 10 on a semiconductor integrated circuit. Then, when the high voltage of 10V or more is applied by mistake to a VCC pad 12 by the user, a current is allowed to flow on the detection circuit 20, and the fuse F is cut by fusing. When the fuse F is out by fusing, a detection end A is pulled up to the VCC by the transistor Q, the VCC of 5V is added to the power source pad 12 on the integrated circuit which is in trouble. When a voltmeter is put on a detection pad 14 or 16, the cut by fusing of a fuse, namely, the application of overvoltage can be assumed.
申请公布号 JPS63116442(A) 申请公布日期 1988.05.20
申请号 JP19860263187 申请日期 1986.11.05
申请人 FUJITSU LTD 发明人 TATEMATSU TAKEO
分类号 H01L21/66;G01R31/28;H01L21/8234;H01L27/08;H01L27/088;H01L29/78 主分类号 H01L21/66
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