发明名称 THIN FILM TRANSISTOR AND FORMATION THEREOF
摘要 <p>PURPOSE:To improve the coverage of a film covering a gate electrode and to prevent short-circuit defects, by forming the gate electrode, which is formed on the surface of a transparent insulating substrate 1 with an ITO film so that the end part of the film becomes narrow toward the upper part, and providing a blackened surface layer. CONSTITUTION:An inverted staggered type thin film transistor has the following parts: a plurality of gate electrodes 2 formed on the surface of a transparent insulating substrate 1; gate bus lines for leading out the gate electrodes; and a drain electrode 6 and a source electrode 6' formed on the upper layer parts of the electrodes (ITO layers) 2. The inversely staggered type thin film transistors are arranged in a matrix pattern in correspondence with picture elements. The gate electrode 2 and the gate bus line have a tapered shape so that the end parts become narrower toward the upper parts. At least surface layer 14 consists of a blackened indium tin oxide film. Thus the film having the excellent coverage for the gate electrode can be formed. Application of a self-aligning method with the gate electrode 2 as a mask can be performed.</p>
申请公布号 JPS63114263(A) 申请公布日期 1988.05.19
申请号 JP19860261176 申请日期 1986.10.31
申请人 FUJITSU LTD 发明人 TAKIZAWA HIDEAKI;INOUE ATSUSHI;OKI KENICHI
分类号 H01L27/12;G02F1/136;G02F1/1368;H01L29/78;H01L29/786 主分类号 H01L27/12
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