发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To reduce contact resistance, by coating an electrode window with a reducing metal film, and forming an electrode wiring after the film is alloyed by heat treatment. CONSTITUTION:By a sputtering method, a titanium (Ti) film 21 is spread, which is subjected to a heat treatment in an inactive atmosphere at a temperature of about 800 deg.C. Then the Ti film 21 contacting electrode windows 19 and 20 reduces an oxide film and is alloyed. Thus a TiSi2 film 22 is produced. The Ti film 21 only is selectively eliminated by etching, an aluminum film is spread, and a wiring 10 connecting to a drain electrode 9 and a gate electrode composed of aluminum film is formed by patterning. Like this, by coating the electrode window with a metal film with reducing property, and forming the electrode wiring after they are subjected to a heat treatment and alloyed, a natural oxide film in the electrode window is reduced, and a conductive alloy film is formed. By forming the electrode wiring thereon, contact resistance is reduced.
申请公布号 JPS63114211(A) 申请公布日期 1988.05.19
申请号 JP19860261181 申请日期 1986.10.31
申请人 FUJITSU LTD 发明人 TAKAGI HIDEO
分类号 H01L21/28;H01L21/768 主分类号 H01L21/28
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