发明名称 INSPECTING DEVICE FOR DIODE
摘要 PURPOSE:To enable the extension of an interval for cleaning away solder at clamp sections of clamp mechanisms, by arranging a scraper to rub the clamp section at a clamp mechanism with the rotation of a drum. CONSTITUTION:A drum 10 is rotated intermittently in the direction of the arrow A according to intervals of notches 11 to supply diodes 1 to the notches 11 one at a time by a supply means 12 and the inspected diodes 1 are taken out of the notches 11 by a means 13. Then, the clamp mechanisms 14 and 15 clamp both leads 5 and 6 of a diode 1 while the rotation of the drum 10 is stopped to measure a value of current flowing between both the leads 5 and 6, and then a specified tension force is applied thereto to measure the current value. On the other hand, clamp sections of both the clamp mechanisms 14 and 15 are forced to rub a scraper 16 separately once each time the drum 10 makes a turn, thereby removing solder adhering to the clamp sections.
申请公布号 JPS63113373(A) 申请公布日期 1988.05.18
申请号 JP19860259301 申请日期 1986.10.30
申请人 ROHM CO LTD 发明人 IMAI JUNJI
分类号 H01L21/66;G01R31/18;G01R31/26 主分类号 H01L21/66
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