发明名称 INSPECTING METHOD FOR SHADOW MASK TYPE COLOR CATHODE-RAY TUBE
摘要 PURPOSE:To perform a countermeasure against a glass foreign object occurrence source by analyzing foreign objects attached to a shadow mask with an ion micro-analyzer, detecting the relative strength ratios of constituting elements against silicon, and specifying the constituting elements. CONSTITUTION:Glass foreign objects with different sizes collected from mask holes of the shadow mask of a color CRT are put on an ion micro-analyzer to be measured by a mass spectrograph. Then, the relative strength ratios between the peak value of Si which is the main constituent of glass and the peak values of other elements are determined. Concerning the color, from which bead glass the glass foreign objects are generated among colored bead glasses is specified. Accordingly, glass constituents can be specified, and the glass color can be identified, thus a glass foreign object generating source is specified, and a countermeasure against the glass foreign object generating source is performed, thereby image deficiencies can be prevented.
申请公布号 JPS63114030(A) 申请公布日期 1988.05.18
申请号 JP19860258255 申请日期 1986.10.31
申请人 HITACHI LTD;HITACHI DEVICE ENG CO LTD 发明人 MATSUMOTO TOSHIYUKI;EZAWA MASAYOSHI
分类号 H01J9/38;H01J9/14;H01J9/42 主分类号 H01J9/38
代理机构 代理人
主权项
地址
您可能感兴趣的专利