发明名称 |
Ion beam fast parallel scanning having dipole magnetic lens with nonuniform field |
摘要 |
An ion source provides ions that pass through an analyzing magnet, image slit, and magnetic quadrupole lenses before entering a beam deflector. The deflected ion beam enters a magnetic field established by a dipole magnetic lens of rectangular cross section in planes parallel to the beam plane including the scanned ion beam, and having a variable width gap in a plane perpendicular to the beam plane that provides a parallel scanned ion beam. The parallel scanned ion beam enters a slot-shaped acceleration columnn and then scans a target.
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申请公布号 |
US4745281(A) |
申请公布日期 |
1988.05.17 |
申请号 |
US19860899966 |
申请日期 |
1986.08.25 |
申请人 |
ECLIPSE ION TECHNOLOGY, INC. |
发明人 |
ENGE, HARALD A. |
分类号 |
H01J37/141;G21K1/00;H01J3/14;H01J3/20;H01J37/00;H01J37/147;H01J37/317;(IPC1-7):H01J3/14 |
主分类号 |
H01J37/141 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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