发明名称 Ion beam fast parallel scanning having dipole magnetic lens with nonuniform field
摘要 An ion source provides ions that pass through an analyzing magnet, image slit, and magnetic quadrupole lenses before entering a beam deflector. The deflected ion beam enters a magnetic field established by a dipole magnetic lens of rectangular cross section in planes parallel to the beam plane including the scanned ion beam, and having a variable width gap in a plane perpendicular to the beam plane that provides a parallel scanned ion beam. The parallel scanned ion beam enters a slot-shaped acceleration columnn and then scans a target.
申请公布号 US4745281(A) 申请公布日期 1988.05.17
申请号 US19860899966 申请日期 1986.08.25
申请人 ECLIPSE ION TECHNOLOGY, INC. 发明人 ENGE, HARALD A.
分类号 H01J37/141;G21K1/00;H01J3/14;H01J3/20;H01J37/00;H01J37/147;H01J37/317;(IPC1-7):H01J3/14 主分类号 H01J37/141
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