| 摘要 |
<p>PURPOSE:To obtain the thermal change of a thin film material with out contact by returning reflected or transmitted light when light is made incident on the surface of the thin film material to an optical sensor through a solid medium. CONSTITUTION:The thin film sample 3 of an optical disk material is installed on a heater 2. While the heater raises the temperature at a constant speed, the light from the light source is guided to right above the sample through an optical fiber 6, incident on the sample, and reflected by the surface to return to the optical fiber 6. Further, the light is transmitted to return to an optical fiber 8. The quantity of the returning light is used as a function of temperature to perform data processing based on an optical sensor voltage. Consequently, the dynamic phase shift behavior of the optical disk material is grasped speedily with high accuracy and the performance of the material is evaluated.</p> |
