发明名称 TEST SYSTEM FOR SHARED MEMORY
摘要 <p>PURPOSE:To obtain the overall test result of a test device in a simple way by securing the interface of test information between processors. CONSTITUTION:The processors 2 and 3 are connected to each other by a system bus and share a shared memory 1. This memory 1 is divided into a reference data block 1a, the transfer destination data blocks 1b and 1c, a synchronizing flag 1d and a test result interface block 1e. The processor 2 which controls the test starts the test with the signal input of an input/output terminal 4 and uses the flag 1d to perform the test of the processor 3 together with its own test.</p>
申请公布号 JPS63111554(A) 申请公布日期 1988.05.16
申请号 JP19860255564 申请日期 1986.10.29
申请人 MITSUBISHI ELECTRIC CORP 发明人 KOJIMA KENJI;HARA TAKUMA
分类号 G06F15/16;G06F12/16;G06F15/177 主分类号 G06F15/16
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