发明名称 APPARATUS FOR MEASURING SURFACE STATE
摘要 PURPOSE:To discriminate whether a flaw is present while glossiness is measured, by operating the presence of a flaw and the glossiness of a surface from which a flaw part is removed on the basis of the max. value of light intensity and the standard deviation thereof. CONSTITUTION:The light emitted from a lamp 1 transmits through a pattern 3 through a diffusion plate 2 and the transmitted light is reflected from the surface 9 of a specimen to be measured through a projection lens 5 to be formed into an image on the surface of the image sensor of a photoelectric converter unit 6. The unit 6 photoelectrically converts the pattern image and an electric output signal is emitted from each output element thereof. The output signal from the unit 6 is reduced in noise through LPF 10 and amplified by an amplifier 11 and converted to a digital value through an A/D converter 12 to be once stored in a memory circuit 13. A control unit 14 operates the presence of a flaw, the size thereof and the glossiness of the surface from which a flaw part is removed on the basis of the digital value read from the circuit 13 to output the same to a display 15. Glossiness, the presence of the flaw and the size thereof are displayed on the display 15.
申请公布号 JPS63109351(A) 申请公布日期 1988.05.14
申请号 JP19860255505 申请日期 1986.10.27
申请人 TOKAI RIKA CO LTD 发明人 OGURI MAMORU
分类号 G01B11/30;G01N21/57;G01N21/88;G01N21/93 主分类号 G01B11/30
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